This system is developed for inserting IV/L measurements during device lifetime measurement; users can incorporate IV/L measurements at three stages: before, during (at set intervals), and after lifetime measurement.

The spectrometer scanning OLED device lifetime testing under high and low temperature environments adopts independent testing channels. It uses a spectrometer for OLED TEG optical testing, connects to an independent testing system, and can independently control the temperature, current/voltage of each jig.

It can accommodate testing of two different sizes of TEGs, measuring luminance, chromaticity (x/y), color temperature, lifetime, IVL within the range of ambient temperature and high-low temperature (-40℃~100℃), as well as high-low temperature shock testing, etc.

System Composition

1. Fully enclosed darkroom machine (including 3-axis motion control system)
2. Spectroradiometer
3. Visual positioning system
4. Temperature control system (optional): Using water bath circulator + semiconductor heating and cooling, with a temperature range of -40℃~100℃
5. Fixtures: Ambient temperature fixtures, high-low temperature fixtures (-40℃~100℃)
6. Lifetime testing constant current/constant voltage source
7. IL testing source meter, UPS
8. Industrial computer
9. OLED device IVL and Lifetime hybrid testing software

System Features

The lifetime testing software and IVL measurement software are integrated into one software package, enabling IV/L measurements before, during, and after lifetime measurement.

1. Configurable to enable/disable CCD positioning photography and automatic channel switching;
2. Power supply output supports constant current and constant voltage output;
3. Lifetime measurement can be set to enable temperature control, with lifetime measurement duration dividable into three segments with arbitrarily set time;
4. Lifetime preprocessing: Configurable temperature preprocessing, voltage/current preprocessing;
5. Equipped with high-low temperature thermal shock function;
6. IVL measurement: Output modes include voltage and current density; IV/L output settings, step size, and measurement time interval;
7. Report introduction: Lifetime report output includes information such as time, luminance and chromaticity, V, I, AV, △I, temperature, etc.; IV/L report output includes information such as time, luminance, V, I, current density, etc.