Multi-chip OLED Device I-V-L Measurement System

When only mass I-V-L testing is required without viewing angle testing, the stations can be flexibly configured. Examples of such configurations include:
① Multi-station ambient temperature I-V-L testing
② Multi-station ambient temperature I-V-L testing + station viewing angle testing
③ Multi-station ambient temperature I-V-L testing + 1 station with high-low temperature control I-V-L testing
and other combined configurations.

Measurement Software for OLED Device I-V-L Testing System

Settings for I-V-L Curve Measurement

1. Continuous measurement can be performed by setting the start voltage, end voltage, and voltage step.
2. Continuous measurement can be performed by setting the start current density, end current density, and current density step.
3. The lower limit for luminance detection of current density can be set independently; when below the lower limit, only current and voltage are measured; when exceeding the lower limit, data such as voltage, current, and luminance are measured simultaneously.
4. Set model parameters can be saved and directly retrieved for measurement next time.

I-V-L Measurement Data

The measurement results include: luminance L (cd/m²), current efficiency (mA/cm²), luminous efficiency, external quantum efficiency (EQE), chromatic coordinates (x, y), color temperature, color rendering index (CRI), and emission spectrum.

The charts included in the output measurement report are: Cdens-V, Cdens-L, Cdens-LumE, Cdens-EQE, CIE1931, and Spectra.

Software Interface