OLED Device Lifetime Testing System with Spectrometer Scanning (Ambient Temperature)
The silicon photoelectric lifetime testing machine provides an economical testing method for OLED device lifetime. However, it is limited by the fact that the response curve of silicon photoelectric devices to the visible light spectrum cannot be completely matched with the CIE human eye visual function. When the spectral shape of the device changes or the spectral peak shifts during the lifetime decay process, the measured relative luminance value will no longer be accurate.In order to measure the absolute luminance value of OLED devices, as well as the changes in chromaticity and spectrum during the decay process, FS-DAS has developed a spectrometer-scanning OLED device lifetime testing solution. A spectroradiometer is installed on the XYZ automatic moving axis to scan the luminance, chromaticity and spectral data of each light-emitting point of the device respectively, so as to obtain the time-varying curves of luminance, chromaticity and spectrum of the device during the lifetime decay process.
System Composition
- FS-GA3 Platform, including a 3-axis linear motion control module
- Spectroradiometer
- Automatic visual alignment industrial camera
- Multi-channel constant voltage/constant current output lifetime testing power supply
- Multi-channel voltage and current measurement module
- Multiple sets of device testing jigs (optional room temperature or independent temperature control)
- OLED device lifetime measurement software
- Industrial computer
Automatic Identification of Light-Emitting Point Positions
The OLED Device Lifetime Testing Platform is equipped with an industrial visual alignment camera. It automatically scans the placement positions of OLED devices in all stations before each measurement, identifies the center coordinates and dimensions of OLEDs without manual alignment, simplifying the operation process.
High Precision of Power Output and Measurement
The system employs the Keithley 3706A multiplexing digital multimeter to measure the output voltage and current of all channels. Meanwhile, the software corrects the power supply output based on the voltage and current values measured by the 3706A, resulting in a current output error of less than 2μA.
Software Functions
- Luminance measurement interval setting: Three time periods can be set, with each period allowing independent configuration of measurement intervals.
- Lifetime cutoff luminance ratio setting: Measurement stops automatically when the measured luminance ratio falls below the set threshold.
- Lifetime prediction: Generates lifetime estimates based on measured data.
- Pre-lighting function: Clicking this button lights up all selected measurement stations according to the set voltage or current output, enabling pre-measurement checks for abnormal lighting.
- Measured data includes: measurement time, voltage, current, elapsed testing duration, remaining luminance ratio, luminance value (cd/m²), chromaticity coordinates (x, y, u', v'), and CRI value. If spectral measurement is enabled, spectral data is automatically collected during each luminance measurement and saved independently in a report.
